HREM INVESTIGATIONS OF THE NISI2/SI(111) INTERFACES BOUNDING A-TYPE NISI2 ISLANDS ON SI(111)

被引:11
作者
WERNER, P [1 ]
MATTHEIS, R [1 ]
HESSE, D [1 ]
HILLEBRAND, R [1 ]
HEYDENREICH, J [1 ]
机构
[1] ACAD SCI GDR,INST PHYS TECH,O-6900 JENA,GERMANY
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1989年 / 116卷 / 01期
关键词
D O I
10.1002/pssa.2211160109
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:81 / 90
页数:10
相关论文
共 15 条
  • [1] STRUCTURE-ANALYSIS OF THE NISI2/(111)SI INTERFACE BY THE X-RAY STANDING WAVE METHOD
    AKIMOTO, K
    ISHIKAWA, T
    TAKAHASHI, T
    KIKUTA, S
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (12): : L798 - L800
  • [2] BULLELIEUWMA CWT, 1989, HETEROSTRUCTURES SIL, P247
  • [3] ATOMIC-STRUCTURE OF THE NISI2/(111)SI INTERFACE
    CHERNS, D
    ANSTIS, GR
    HUTCHISON, JL
    SPENCE, JCH
    [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (05): : 849 - 862
  • [4] FOLL F, 1981, J APPL PHYS, V52, P250, DOI 10.1063/1.328440
  • [5] FOLL H, 1982, PHILOS MAG A, V45, P31, DOI 10.1080/01418618208243901
  • [6] GIBSON JM, 1982, APPL PHYS LETT, V41, P818, DOI 10.1063/1.93699
  • [7] THE GROWTH-BEHAVIOR OF EPITAXIAL NISI2 ISLANDS OF A-TYPE AND B-TYPE DURING THE REACTION OF NICKEL VAPOR WITH THE SI(111) SURFACE
    HESSE, D
    MATTHEIS, R
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 116 (01): : 67 - 80
  • [8] SCHOTTKY-BARRIER HEIGHTS OF EPITAXIAL NI-SILICIDES ON SI(111)
    LIEHR, M
    SCHMID, PE
    LEGOUES, FK
    HO, PS
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 855 - 859
  • [9] FORMATION OF ULTRATHIN SINGLE-CRYSTAL SILICIDE FILMS ON SI - SURFACE AND INTERFACIAL STABILIZATION OF SI-NISI2 EPITAXIAL STRUCTURES
    TUNG, RT
    GIBSON, JM
    POATE, JM
    [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (06) : 429 - 432
  • [10] EPITAXIAL SILICIDES
    TUNG, RT
    POATE, JM
    BEAN, JC
    GIBSON, JM
    JACOBSON, DC
    [J]. THIN SOLID FILMS, 1982, 93 (1-2) : 77 - 90