RAMAN-SCATTERING FROM BORON-NITRIDE COATINGS AT HIGH-TEMPERATURES

被引:33
作者
EXARHOS, GJ [1 ]
SCHAAF, JW [1 ]
机构
[1] LOWER COLUMBIA COLL, LONGVIEW, WA 98632 USA
关键词
D O I
10.1063/1.348695
中图分类号
O59 [应用物理学];
学科分类号
摘要
The temperature dependence from ambient to 2325 K of the high frequency E2g mode intrinsic to the hexagonal phase of boron nitride has been determined using a pulsed-excitation gated-detection technique which effectively discriminates against sample blackbody emission. A monotonic decrease of 80 cm-1 in mode frequency accompanied by a marked increase in linewidth was observed over this temperature range. Simultaneous acquisition of both Stokes and anti-Stokes Raman scattering has been demonstrated and provides another method by which sample temperatures may be verified. Variations in measured linewidth and mode frequency are described in terms of an anharmonic oscillator model from which the intralamellar thermal expansion coefficient is estimated.
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页码:2543 / 2548
页数:6
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共 22 条
[1]  
Babich I. L., 1972, Theoretical and Experimental Chemistry, V8, P594, DOI 10.1007/BF00526930
[2]  
Bruesch P., 1982, SPRINGER SERIES SOLI, V34, P152
[3]   EFFECT OF CARRIER CONCENTRATION ON RAMAN FREQUENCIES OF SI AND GE [J].
CERDEIRA, F ;
CARDONA, M .
PHYSICAL REVIEW B, 1972, 5 (04) :1440-&
[4]   THE LATTICE DYNAMICS OF AN ANHARMONIC CRYSTAL [J].
COWLEY, RA .
ADVANCES IN PHYSICS, 1963, 12 (48) :421-480
[5]  
Exarhos G. J., 1989, Proceedings of the SPIE - The International Society for Optical Engineering, V1055, P185, DOI 10.1117/12.951588
[6]  
EXARHOS GJ, 1988, 11TH P INT C RAM SPE, P503
[7]   TEMPERATURE DEPENDENCE OF RAMAN SCATTERING IN SILICON [J].
HART, TR ;
AGGARWAL, RL ;
LAX, B .
PHYSICAL REVIEW B-SOLID STATE, 1970, 1 (02) :638-&
[8]   TEMPERATURE DEPENDENCE OF INFRARED DISPERSION IN IONIC CRYSTALS LIF AND MGO [J].
JASPERSE, JR ;
KAHAN, A ;
PLENDL, JN ;
MITRA, SS .
PHYSICAL REVIEW, 1966, 146 (02) :526-+
[9]   LOW-FREQUENCY RAMAN-ACTIVE VIBRATION OF HEXAGONAL BORON-NITRIDE [J].
KUZUBA, T ;
ERA, K ;
ISHII, T ;
SATO, T .
SOLID STATE COMMUNICATIONS, 1978, 25 (11) :863-865
[10]   TEMPERATURE DEPENDENCE OF SOFT-MODE LINE-WIDTH OF QUARTZ [J].
LAULICHT, I ;
SCHLESINGER, Y ;
BAGNO, I .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1972, 33 (02) :319-+