CONTROLLING SURFACE BAND-BENDING OF INP WITH POLYSULFIDE TREATMENTS

被引:25
作者
LAU, WM
KWOK, RWM
INGREY, S
机构
[1] UNIV WESTERN ONTARIO,DEPT MAT ENGN,LONDON N6A 5B7,ONTARIO,CANADA
[2] BELL NO RES,SECT C,OTTAWA K1Y 4H7,ONTARIO,CANADA
关键词
D O I
10.1016/0039-6028(92)90919-W
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Surface modification of InP by exposure to hydrogen polysulfide vapor at room temperature and by subsequent heating were studied by X-ray photoelectron spectroscopy (XPS). The XPS measured surface Fermi level (E(Fs)) position of polysulfide treated p-InP changed from 0.5 eV, relative to the valence band maximum (VBM), to 1.2 eV by beating the exposed surface at 300-degrees-C for a few minutes in vacuum. Further beating at 400-degrees-C for a few hours resulted in E(Fs) moving back to a position 0.5 eV above the VBM. Surface chemistry changes determined by XPS during this rather large movement of E(Fs) suggest a mechanism which involves the following three steps: (a) the exposure of InP to polysulfides reduces surface states in the bandgap; (b) heating of the exposed surface converts weakly adsorbed polysulfides to more strongly adsorbed species which contribute donor states near the conduction band minimum; (c) heating at 400-degrees-C slowly desorbs the surface donor species and gradually returns the E(Fs) of a p-substrate to its original 0.5 eV above the VBM.
引用
收藏
页码:579 / 586
页数:8
相关论文
共 18 条
  • [1] FERMI LEVEL PINNING DURING OXIDATION OF ATOMICALLY CLEAN N-INP(110)
    BERTNESS, KA
    KENDELEWICZ, T
    LIST, RS
    WILLIAMS, MD
    LINDAU, I
    SPICER, WE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1424 - 1426
  • [2] UNPINNED SCHOTTKY-BARRIER FORMATION AT METAL GAAS INTERFACES
    BRILLSON, LJ
    VITURRO, RE
    MAILHIOT, C
    SHAW, JL
    TACHE, N
    MCKINLEY, J
    MARGARITONDO, G
    WOODALL, JM
    KIRCHNER, PD
    PETTIT, GD
    WRIGHT, SL
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (04): : 1263 - 1269
  • [3] SULFUR AS A SURFACE PASSIVATION FOR INP
    IYER, R
    CHANG, RR
    LILE, DL
    [J]. APPLIED PHYSICS LETTERS, 1988, 53 (02) : 134 - 136
  • [4] THE EFFECT OF PHOSPHORUS AND SULFUR TREATMENT ON THE SURFACE-PROPERTIES OF INP
    IYER, R
    CHANG, RR
    DUBEY, A
    LILE, DL
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (04): : 1174 - 1179
  • [5] KWOK RWM, IN PRESS J VAC SCI T
  • [6] KWOK RWM, 1991, THESIS U W ONTARIO
  • [7] INSITU X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF REMOTE PLASMA ENHANCED CHEMICAL VAPOR-DEPOSITION OF SILICON-NITRIDE ON SULFIDE PASSIVATED INP
    LAU, WM
    JIN, S
    WU, XW
    INGREY, S
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (04): : 848 - 855
  • [8] STUDIES ON TYPE-INVERSION OF SULFIDE-TREATED P-INP
    LAU, WM
    JIN, S
    WU, XW
    INGREY, S
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 994 - 997
  • [9] CHANGES IN SURFACE-COMPOSITION AND FERMI LEVEL POSITION DURING THERMAL-DESORPTION OF ULTRAVIOLET-RADIATION OZONE FORMED OXIDES ON GAAS
    LAU, WM
    SODHI, RNS
    JIN, S
    INGREY, S
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (03): : 1899 - 1906
  • [10] DRAMATIC ENHANCEMENT IN THE GAIN OF A GAAS/ALGAAS HETEROSTRUCTURE BIPOLAR-TRANSISTOR BY SURFACE CHEMICAL PASSIVATION
    SANDROFF, CJ
    NOTTENBURG, RN
    BISCHOFF, JC
    BHAT, R
    [J]. APPLIED PHYSICS LETTERS, 1987, 51 (01) : 33 - 35