EVALUATION OF THE ROUGHNESS OF A CRYSTAL-SURFACE BY X-RAY-SCATTERING .1. THEORETICAL CONSIDERATIONS

被引:32
作者
HARADA, J
机构
来源
ACTA CRYSTALLOGRAPHICA SECTION A | 1992年 / 48卷
关键词
D O I
10.1107/S0108767392003246
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The relationship between the intensity distributions of the crystal truncation rod (CTR) scattering and the surface roughness of a crystal is discussed by developing a kinematic theory for the CTR scattering so as to reflect the two-dimensional aspect of the surface. The intensity of the CTR scattering elongated from a Bragg point is shown to be reduced by a factor \GAMMA(q)\2 for a surface possessing some roughness, where GAMMA(q) is defined by a simple Fourier summation of gamma(p), the relative area with the same step height p on a surface, i.e. GAMMA(q) = SIGMA(p=0)infinity gamma(p) exp (2-pi-ipq), with SIGMA(p) gamma(p) = 1, q being the distance in reciprocal space from the Bragg point along the CTR scattering. A pair-correlation function between the steps can, therefore, be obtained by a simple Fourier integral of the roughness damping factor \GAMMA(q)\2. For the case where gamma(p) has a Gaussian distribution around the average step height, \GAMMA(q)\2 is approximated by the well known Debye-Waller-like factor, exp (-4-pi-2[DELTA-p2]q2), where [DELTA-p2] is the mean square deviation of step height in units of the lattice spacing. The intensity formulae proposed so far by several authors are also discussed on the basis of the above factor.
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页码:764 / 771
页数:8
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