OXIDATION OF SILICON IN RF INDUCED OXYGEN PLASMA

被引:10
作者
SHARMA, SK
CHAKRAVARTY, BC
SINGH, SN
DAS, BK
机构
[1] Division of Materials, National Physical Laboratory, New Delhi
关键词
D O I
10.1007/BF00722196
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
[No abstract available]
引用
收藏
页码:982 / 984
页数:3
相关论文
共 15 条
[1]   OXYGEN-PRESSURE AS A PARAMETER IN THE DC PLASMA ANODIZATION OF SILICON [J].
BECK, RB ;
PATYRA, M ;
RUZYLLO, J ;
JAKUBOWSKI, A .
THIN SOLID FILMS, 1980, 67 (02) :261-264
[2]   THEORY OF THE OXIDATION OF METALS [J].
CABRERA, N ;
MOTT, NF .
REPORTS ON PROGRESS IN PHYSICS, 1948, 12 :163-184
[3]   EFFECT OF THE GROWTH OF THIN SIO INTERLAYERS ON THE PERFORMANCE OF SI SOLAR-CELLS [J].
CHAKRAVARTY, BC ;
SHARMA, SK ;
SINGH, SN ;
DAS, BK ;
KUMAR, R ;
CHAKRABORTY, BR .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 115 (01) :K125-K128
[4]   GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON [J].
DEAL, BE ;
GROVE, AS .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3770-&
[5]  
ITO K, 1983, IEEE P, V130, P127
[6]  
KERN W, 1970, RCA REV, V31, P187
[7]   MICROWAVE-DISCHARGE PLASMA OXIDATION OF SILICON IN A CUSP MAGNETIC-FIELD [J].
KIMURA, S ;
MURAKAMI, E ;
WARABISAKO, T ;
SUNAMI, H .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) :2009-2012
[8]   LOW-TEMPERATURE OXIDATION OF SILICON IN A MICROWAVE-DISCHARGED OXYGEN PLASMA [J].
KIMURA, SI ;
MURAKAMI, E ;
MIYAKE, K ;
WARABISAKO, T ;
SUNAMI, H ;
TOKUYAMA, T .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (06) :1460-1466
[9]   A QUASI-STATIC TECHNIQUE FOR MOS C-V AND SURFACE STATE MEASUREMENTS [J].
KUHN, M .
SOLID-STATE ELECTRONICS, 1970, 13 (06) :873-+
[10]   MICROWAVE PLASMA STREAM TRANSPORT-SYSTEM FOR LOW-TEMPERATURE PLASMA OXIDATION [J].
MIYAKE, K ;
KIMURA, S ;
WARABISAKO, T ;
SUNAMI, H ;
TOKUYAMA, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02) :496-499