DETECTION OF THE ACTIVE LAYER OF AIIIBV SEMICONDUCTOR QUANTUM-WELL STRUCTURES BY HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY

被引：14

作者：

BAUMBACH, GT

RHAN, H

PIETSCH, U

机构：

[1] Karl-Marx-Univ Leipzig, Germany

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1988年 / 109卷 / 01期

关键词：

D O I：

10.1002/pssa.2211090142

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

9

引用

收藏

页码：K7 / K10

页数：4

相关论文

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