HIGH-CARBON DOPING EFFICIENCY OF BROMOMETHANES IN GAS SOURCE MOLECULAR-BEAM EPITAXIAL-GROWTH OF GAAS

被引:68
作者
DELYON, TJ
BUCHAN, NI
KIRCHNER, PD
WOODALL, JM
SCILLA, GJ
CARDONE, F
机构
[1] IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
关键词
D O I
10.1063/1.104600
中图分类号
O59 [应用物理学];
学科分类号
摘要
Carbon tetrabromide (CBr4) and bromoform (CHBr3) have been studied as carbon doping sources for GaAs grown by gas source molecular beam epitaxy (GSMBE) with elemental Ga and thermally cracked AsH3. Hole concentrations in excess of 1 x 10(20) cm-3 have been measured by Hall effect in both CBr4- and CHBr3-doped GaAs, which agrees closely with the atomic C concentration from secondary-ion mass spectrometry, indicating complete electrical activity of the incorporated carbon. The GaAs growth rate is unaffected by the CBr4 and CHBr3 fluxes over the range of dopant flow investigated. The efficiencies of carbon incorporation from CBr4 and CHBr3 are, respectively, 750 and 25 times that of trimethylgallium (TMG), which is commonly employed as a carbon doping source in metalorganic MBE (MOMBE). The sensitivity of carbon incorporation to varying substrate temperature and V/III ratio has been observed to be significantly reduced with CBr4 and CHBr3 from that obtained under similar growth conditions with TMG in MOMBE.
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页码:517 / 519
页数:3
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