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EFFECT OF ROOM-TEMPERATURE AGING ON INFRARED-ABSORPTION SPECTRA OF THIN-FILMS OF SILICON OXIDE
被引:3
作者
:
TIMSON, P
论文数:
0
引用数:
0
h-index:
0
TIMSON, P
BEYNON, J
论文数:
0
引用数:
0
h-index:
0
BEYNON, J
机构
:
来源
:
VACUUM
|
1972年
/ 22卷
/ 06期
关键词
:
D O I
:
10.1016/0042-207X(72)90658-6
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:233 / &
相关论文
共 4 条
[1]
CHARACTERIZATION OF SIO USING FINE FEATURES OF X-RAY K EMISSION SPECTRA
[J].
BAUN, WL
论文数:
0
引用数:
0
h-index:
0
BAUN, WL
;
SOLOMON, JS
论文数:
0
引用数:
0
h-index:
0
SOLOMON, JS
.
VACUUM,
1971,
21
(05)
:165
-&
[2]
BEYNON J, 1970, VACUUM, V20, P293
[3]
EVALUATION OF THIN FILM INSULATORS
[J].
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
.
THIN SOLID FILMS,
1968,
2
(1-2)
:1
-&
[4]
ELECTRON SPIN RESONANCE STUDY OF REACTIVELY EVAPORATED SILICON OXIDE
[J].
TIMSON, PA
论文数:
0
引用数:
0
h-index:
0
TIMSON, PA
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
HOGARTH, CA
.
THIN SOLID FILMS,
1971,
8
(04)
:237
-&
←
1
→
共 4 条
[1]
CHARACTERIZATION OF SIO USING FINE FEATURES OF X-RAY K EMISSION SPECTRA
[J].
BAUN, WL
论文数:
0
引用数:
0
h-index:
0
BAUN, WL
;
SOLOMON, JS
论文数:
0
引用数:
0
h-index:
0
SOLOMON, JS
.
VACUUM,
1971,
21
(05)
:165
-&
[2]
BEYNON J, 1970, VACUUM, V20, P293
[3]
EVALUATION OF THIN FILM INSULATORS
[J].
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
.
THIN SOLID FILMS,
1968,
2
(1-2)
:1
-&
[4]
ELECTRON SPIN RESONANCE STUDY OF REACTIVELY EVAPORATED SILICON OXIDE
[J].
TIMSON, PA
论文数:
0
引用数:
0
h-index:
0
TIMSON, PA
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
HOGARTH, CA
.
THIN SOLID FILMS,
1971,
8
(04)
:237
-&
←
1
→