SI/SIGE EPITAXIAL-BASE TRANSISTORS .2. PROCESS INTEGRATION AND ANALOG APPLICATIONS

被引:162
作者
HARAME, DL
COMFORT, JH
CRESSLER, JD
CRABBE, EF
SUN, JYC
MEYERSON, BS
TICE, T
机构
[1] MICROELECTR SCI & TECHNOL CTR,HOPEWELL JCT,NY 12533
[2] AUBURN UNIV,ALABAMA MICROELECTR SCI & TECHNOL CTR,DEPT ELECT ENGN,AUBURN,AL 36849
[3] ANALOG DEVICES INC,GREENSBORO,NC 27409
关键词
D O I
10.1109/16.368043
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This is the second part of a detailed review of SiGe epitaxial-base technology, The complete review chronicles the developments in materials deposition, device physics and profile design, self-aligned device and circuit demonstrations which culminated in the first fully integrated circuit applications, In Part I [1] the requirements and processes required for high-quality SiGe him preparation and a detailed overview of SiGe HBT device design were discussed. This part will focus on process integration concerns, first described in general terms and then detailed through an extensive review of both simple non-self-aligned device structures and more complex self-aligned device structures. The extension of SiGe device technology to high levels of integration is then discussed through a detailed review of a full SiGe HBT BICMOS process, Finally, analog circuit design is discussed and concluded with a description of a 12-bit Digital-to-Analog Converter presented to highlight the current status of SiGe technology.
引用
收藏
页码:469 / 482
页数:14
相关论文
共 58 条
[1]   BIPOLAR-TRANSISTOR FABRICATION IN LOW-TEMPERATURE (745-DEGREES-C) ULTRA-LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITED EPITAXIAL SILICON [J].
BURGER, WR ;
COMFORT, JH ;
GARVERICK, LM ;
YEW, TR ;
REIF, R .
IEEE ELECTRON DEVICE LETTERS, 1987, 8 (04) :168-170
[2]  
Burghartz J. N., 1990, International Electron Devices Meeting 1990. Technical Digest (Cat. No.90CH2865-4), P297, DOI 10.1109/IEDM.1990.237171
[3]   SELF-ALIGNED SIGE-BASE HETEROJUNCTION BIPOLAR-TRANSISTOR BY SELECTIVE EPITAXY EMITTER WINDOW (SEEW) TECHNOLOGY [J].
BURGHARTZ, JN ;
COMFORT, JH ;
PATTON, GL ;
MEYERSON, BS ;
SUN, JYC ;
STORK, JMC ;
MADER, SR ;
STANIS, CL ;
SCILLA, GJ ;
GINSBERG, BJ .
IEEE ELECTRON DEVICE LETTERS, 1990, 11 (07) :288-290
[4]   SELECTIVE EPITAXY BASE TRANSISTOR (SEBT) [J].
BURGHARTZ, JN ;
GINSBERG, BJ ;
MADER, SR ;
CHEN, TC ;
HARAME, DL .
IEEE ELECTRON DEVICE LETTERS, 1988, 9 (05) :259-261
[5]  
BURGHARTZ JN, 1989, S VLSI TECHNOL, P57
[6]  
Comfort J. H., 1990, International Electron Devices Meeting 1990. Technical Digest (Cat. No.90CH2865-4), P21, DOI 10.1109/IEDM.1990.237235
[7]  
Comfort J. H., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P857, DOI 10.1109/IEDM.1991.235290
[8]  
COMFORT JKH, 1990, VLSI, P51
[9]   SURFACTANTS IN EPITAXIAL-GROWTH [J].
COPEL, M ;
REUTER, MC ;
KAXIRAS, E ;
TROMP, RM .
PHYSICAL REVIEW LETTERS, 1989, 63 (06) :632-635
[10]  
CRABBE E, 1993, 1993 P DEV RES C SAN