SELENIUM IMPLANTATION IN EPITAXIAL GALLIUM-ARSENIDE LAYERS

被引:5
作者
INADA, T [1 ]
TOKUNAGA, K [1 ]
TAKA, S [1 ]
YUGE, Y [1 ]
KOHZU, H [1 ]
机构
[1] NIPPON ELECT CO LTD,DIV SEMICOND,NAKAHARA KU,KAWASAKI 211,JAPAN
来源
NUCLEAR INSTRUMENTS & METHODS | 1981年 / 182卷 / APR期
关键词
D O I
10.1016/0029-554X(81)90800-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:709 / 717
页数:9
相关论文
共 13 条
[11]   ANODIC-OXIDATION OF GAAS AS A TECHNIQUE TO EVALUATE ELECTRICAL CARRIER CONCENTRATION PROFILES [J].
MULLER, H ;
EISEN, FH ;
MAYER, JW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (05) :651-655
[12]   RESISTIVITY MOBILITY AND IMPURITY LEVELS IN GAAS GE AND SI AT 300 DEGREES K [J].
SZE, SM ;
IRVIN, JC .
SOLID-STATE ELECTRONICS, 1968, 11 (06) :599-&
[13]   SILICON IMPLANTATION IN GAAS [J].
TANDON, JL ;
NICOLET, MA ;
EISEN, FH .
APPLIED PHYSICS LETTERS, 1979, 34 (02) :165-167