RELIABILITY AND FAILURE MECHANISMS OF ELECTRONIC MATERIALS

被引：10

作者：

ENGLISH, AT

MELLIARSMITH, CM

机构：

来源：

ANNUAL REVIEW OF MATERIALS SCIENCE | 1978年 / 8卷

关键词：

D O I：

10.1146/annurev.ms.08.080178.002331

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：459 / 495

页数：37

共 95 条

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