PREPARATION OF RUTILE TIO2 FILMS BY RF MAGNETRON SPUTTERING

被引:79
作者
OKIMURA, K
SHIBATA, A
MAEDA, N
TACHIBANA, K
NOGUCHI, Y
TSUCHIDA, K
机构
[1] KYOTO INST TECHNOL,SAKYO KU,KYOTO 606,JAPAN
[2] KURMO DENKO CO LTD,FUKUI 915,JAPAN
[3] FUKUI IND TECH CTR,FUKUI 910,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1995年 / 34卷 / 9A期
关键词
RUTILE TIO2 FILM; CRYSTALLINE PHASE CHANGE; RF MAGNETRON SPUTTERING; PLASMA DIAGNOSTICS;
D O I
10.1143/JJAP.34.4950
中图分类号
O59 [应用物理学];
学科分类号
摘要
TiO2 films were prepared by rf (13.56 MHz) magnetron sputtering using a mixture of Ar and O-2 gases. At a total pressure of 2 mTorr, 100% rutile TiO2 films were successfully obtained on non heated substrates with rf power of 200 W, while 100% anatase TiO2, films were deposited at a pressure of 20 mTorr. Spatial profiles of both emission of excited species and plasma parameters were measured by optical emission spectroscopy (OES) and the Langmuir probe method. At a pressure of 2 mTorr, it was found that high-energy electrons are generated at a certain radial position near the cathode surface where the transverse magnetic field is maximum, and the strong localization of plasma was observed. It was proven that the energetic species impinging on the growing film are responsible for the formation of the rutile phase even if the substrate is at room temperature.
引用
收藏
页码:4950 / 4955
页数:6
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