HOPPING IN EXPONENTIAL BANDTAILS IN HIGH ELECTRIC-FIELDS AND TRANSPORT MODELS IN AMORPHOUS-SILICON

被引:7
作者
DEVLEN, RI
ANTONIADIS, H
SCHIFF, EA
TAUC, J
机构
[1] SYRACUSE UNIV,DEPT PHYS,SYRACUSE,NY 13244
[2] BROWN UNIV,DEPT PHYS,PROVIDENCE,RI 02912
[3] MAX PLANCK INST FESTKORPERFORSCH,W-7000 STUTTGART 80,GERMANY
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1993年 / 68卷 / 03期
关键词
D O I
10.1080/13642819308215291
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A calculation of electrical transport during the thermalization of excess carrier hopping between states of an exponential bandtail is presented. The calculation is based on a typical rate approximation. For small electric fields the calculation reproduces multiple-trapping dispersion, in agreement with prior research. For high electric fields electrical transport becomes nonlinear, primarily due to an electric-field-induced increase in the dispersion parameter. The calculation should be contrasted to recent work of Esipov which extended bandtail multiple-trapping to incorporate tunnelling to a transport edge; in his calculation nonlinear transport set in without changes in the dispersion. We suggest that these results discriminate between hopping and mobility-edge models for electron thermalization measurements in a-Si: H.
引用
收藏
页码:341 / 355
页数:15
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