WIDE-BAND GAP SIH AT LOW H-CONTENT PREPARED BY INTERRUPTED GROWN AND H-PLASMA TREATMENT

被引:10
作者
DAS, D
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1994年 / 33卷 / 4B期
关键词
INTERRUPTED GROWTH; H-PLASMA EXPOSURE; WIDE BAND GAP; NANO-CRYSTALLIZATION;
D O I
10.1143/JJAP.33.L571
中图分类号
O59 [应用物理学];
学科分类号
摘要
Alternating the deposition of thin layers of a-Si:H at 100-degrees-C and exposure to r.f. H-plasma periodically, an widening of optical band gap by 20% along with the reduction in hydrogen content by 80% was observed in stacked layers. Interrupted growth and H-plasma treatment has been established as an effective technique for the elimination of hydrogen from Si:H network, however, simultaneous widening of optical band gap appears to be an interesting feature related to Nano-crystallization and quantum size effect in hydrogenated binary alloy.
引用
收藏
页码:L571 / L574
页数:4
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