IMPROVED TECHNIQUE FOR VOLTAGE MEASUREMENT USING SCANNING-ELECTRON MICROSCOPE

被引：4

作者：

FLEMMING, JP

WARD, EW

机构：

来源：

关键词：

D O I：

10.1049/el:19700005

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：7 / &

共 5 条

[1] DRIVER MC, 1969, P IITRI C SCANNING E, P405
[2] IMPROVED TECHNIQUE FOR VOLTAGE MEASUREMENT IN SCANNING-ELECTRON MICROSCOPE
FLEMING, JP
WARD, EW
[J]. ELECTRONICS LETTERS, 1969, 5 (18) : 435 - &
[3] A LOW ENERGY SCANNED ELECTRON BEAM POTENTIAL PROBE
FLEMMING, JP
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (12): : 1179 - &
[4] ELECTRON BEAM SCANNING TECHNIQUE FOR MEASURING SURFACE WORK FUNCTION VARIATIONS
HAAS, GA
THOMAS, RE
[J]. SURFACE SCIENCE, 1966, 4 (01) : 64 - &
[5] VOLTAGE MEASUREMENT IN SCANNING ELECTRON MICROSCOPE
WELLS, OC
BREMER, CG
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (09): : 902 - &