DETERMINATION OF SURFACE-ROUGHNESS FROM SCATTERED-LIGHT MEASUREMENTS

被引：4

作者：

HILLEBRECHT, FU ^{[1
]}

机构：

[1] INST ANGEW PHYS,D-2000 HAMBURG 36,FED REP GER

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1980年 / 13卷 / 09期

关键词：

D O I：

10.1088/0022-3727/13/9/009

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1625 / 1631

页数：7

共 11 条

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[6] DETERMINATION OF SURFACE-ROUGHNESS OF THIN-FILMS USING MEASUREMENT OF ANGULAR-DEPENDENCE OF SCATTERED LIGHT FROM SURFACE PLASMA-WAVES [J].

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