X-RAY-ANALYSIS OF LATTICE IMPERFECTIONS AND DISTORTIONS IN A SI/GAP BILAYER

被引：2

作者：

ISHIZUKA, F

ITOH, T

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 66卷 / 07期

关键词：

D O I：

10.1063/1.344483

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3007 / 3010

页数：4

共 24 条

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