THE DEVELOPMENT OF ELECTRON-MICROSCOPY AND RELATED TECHNIQUES AT THE CAVENDISH-LABORATORY, CAMBRIDGE, 1946-79 .1. 1946-60

被引：12

作者：

COSSLETT, VE

机构：

来源：

关键词：

D O I：

10.1080/00107518108231513

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：3 / 36

页数：34

共 62 条

[11] AN IMPROVED X-RAY SHADOW PROJECTION MICROSCOPE [J].

COSSLETT, VE ;

PEARSON, HE .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1954, 31 (07) :255-257

[12] MICRO-ANALYSIS BY A FLYING-SPOT X-RAY METHOD [J].

COSSLETT, VE ;

DUNCUMB, P .

Cosslett, VE .

PROCEEDINGS OF THE PHYSICAL SOCIETY, 1940, 52 :511-517

[14] A REFLEXION ELECTRON MICROSCOPE [J].

COSSLETT, VE ;

JONES, D .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1955, 32 (03) :86-91

COSSLETT, VE .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1946, 58 (328) :443-455

[16] THE RESOLVING POWER OF THE MAGNETIC ELECTRON MICROSCOPE [J].

COSSLETT, VE .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1945, 22 (09) :170-174

[17]

COSSLETT VE, 1946, INTRO ELECTRON OPTIC

[18]

COSSLETT VE, 1956, 3RD P INT C EL MICR, P639

[19]

COSSLETT VE, 1951, PRACTICAL ELECTRON M

[20]

COSSLETT VE, 1957, XRAY MICROSCOPY MICR, P435