MODEL FOR DIFFUSION AND TRAPPING OF HYDROGEN IN CRYSTALLINE SILICON

[1] BORENSTEIN JT, 1989, MAT RES S C, V138, P209

[2] PROTON DIFFUSION IN CRYSTALLINE SILICON [J]. PHYSICAL REVIEW LETTERS, 1989, 63 (03) : 294 - 297

[3] HYDROGEN DIFFUSION ALONG PASSIVATED GRAIN-BOUNDARIES IN SILICON RIBBON [J]. APPLIED PHYSICS LETTERS, 1984, 44 (04) : 425 - 427

[4] HYDROGEN PASSIVATION OF DISLOCATIONS IN SILICON [J]. APPLIED PHYSICS LETTERS, 1984, 45 (10) : 1135 - 1137

[5] ABSENCE OF OXYGEN DIFFUSION DURING HYDROGEN PASSIVATION OF SHALLOW-ACCEPTOR IMPURITIES IN SINGLE-CRYSTAL SILICON [J]. APPLIED PHYSICS LETTERS, 1985, 46 (08) : 787 - 789

[6] MYERS SM, 1988, MATER RES SOC S P, V107, P105

[7] HYDROGEN IN CRYSTALLINE SEMICONDUCTORS [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 43 (03): : 153 - 195

[8] REAL-TIME OBSERVATIONS OF HYDROGEN DRIFT AND DIFFUSION IN SILICON [J]. APPLIED PHYSICS LETTERS, 1988, 53 (13) : 1181 - 1183

[9] A STUDY OF HYDROGEN DIFFUSION IN CRYSTALLINE SILICON BY SECONDARY-ION MASS-SPECTROMETRY [J]. CANADIAN JOURNAL OF PHYSICS, 1989, 67 (04) : 379 - 383

[10] ON THE PERMEATION OF HYDROGEN AND HELIUM IN SINGLE CRYSTAL SILICON AND GERMANIUM AT ELEVATED TEMPERATURES [J]. PHYSICA, 1956, 22 (10): : 849 - 865

[1] BORENSTEIN JT, 1989, MAT RES S C, V138, P209

[2] PROTON DIFFUSION IN CRYSTALLINE SILICON [J]. PHYSICAL REVIEW LETTERS, 1989, 63 (03) : 294 - 297

[3] HYDROGEN DIFFUSION ALONG PASSIVATED GRAIN-BOUNDARIES IN SILICON RIBBON [J]. APPLIED PHYSICS LETTERS, 1984, 44 (04) : 425 - 427

[4] HYDROGEN PASSIVATION OF DISLOCATIONS IN SILICON [J]. APPLIED PHYSICS LETTERS, 1984, 45 (10) : 1135 - 1137

[5] ABSENCE OF OXYGEN DIFFUSION DURING HYDROGEN PASSIVATION OF SHALLOW-ACCEPTOR IMPURITIES IN SINGLE-CRYSTAL SILICON [J]. APPLIED PHYSICS LETTERS, 1985, 46 (08) : 787 - 789

[6] MYERS SM, 1988, MATER RES SOC S P, V107, P105

[7] HYDROGEN IN CRYSTALLINE SEMICONDUCTORS [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 43 (03): : 153 - 195

[8] REAL-TIME OBSERVATIONS OF HYDROGEN DRIFT AND DIFFUSION IN SILICON [J]. APPLIED PHYSICS LETTERS, 1988, 53 (13) : 1181 - 1183

[9] A STUDY OF HYDROGEN DIFFUSION IN CRYSTALLINE SILICON BY SECONDARY-ION MASS-SPECTROMETRY [J]. CANADIAN JOURNAL OF PHYSICS, 1989, 67 (04) : 379 - 383

[10] ON THE PERMEATION OF HYDROGEN AND HELIUM IN SINGLE CRYSTAL SILICON AND GERMANIUM AT ELEVATED TEMPERATURES [J]. PHYSICA, 1956, 22 (10): : 849 - 865