DONOR-RELATED DEEP-LEVEL IN BULK GASB

被引:28
作者
DUTTA, PS [1 ]
RAO, KSRK [1 ]
SANGUNNI, KS [1 ]
BHAT, HL [1 ]
KUMAR, V [1 ]
机构
[1] SOLID STATE PHYS,DELHI 110054,INDIA
关键词
D O I
10.1063/1.112975
中图分类号
O59 [应用物理学];
学科分类号
摘要
Deep level transient spectroscopy (DLTS) and thermally stimulated capacitance (TSCAP) studies on bulk grown tellurium- selenium-, and sulphur-doped gallium antimonide reveal the presence of deep level intrinsic, of the dopant species. The trap densities in Te- and Se-doped samples were found to be at least two orders of magnitude lower than the shallow donor concentration. Interestingly, the DLTS spectrum of S:GaSb exhibits DX-like nature with the trap concentration comparable to that of shallow donor concentration. However, the Te and Se related levels do not exhibit DX-like nature. The DLTS and TSCAP results are in good agreement with each other.
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页码:1412 / 1414
页数:3
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