PHOTOSTIMULATED EVAPORATION OF SIO2-FILMS BY SYNCHROTRON RADIATION

被引:58
作者
AKAZAWA, H
UTSUMI, Y
TAKAHASHI, J
URISU, T
机构
[1] NTT LSI Laboratories, Atsugi-shi, Kanagawa, 3-1, Morinosato Wakamiya
关键词
D O I
10.1063/1.104167
中图分类号
O59 [应用物理学];
学科分类号
摘要
Irradiation by synchrotron radiation on SiO2 films induces continuous removal of this material at elevated temperatures. The photostimulated evaporation rate for a thermally grown SiO2 film increases steeply with temperature giving an activation energy of 0.7 eV. The experimental results indicate that photon-induced bond breaking assists decomposition and thermal desorption of the film. Applications to microfabrication of a line-and-space pattern and low-temperature cleaning of Si(100) surface are demonstrated.
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页码:2302 / 2304
页数:3
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