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REVERSIBILITY OF TRAPPED HOLE ANNEALING
被引:160
作者
:
LELIS, AJ
论文数:
0
引用数:
0
h-index:
0
LELIS, AJ
BOESCH, HE
论文数:
0
引用数:
0
h-index:
0
BOESCH, HE
OLDHAM, TR
论文数:
0
引用数:
0
h-index:
0
OLDHAM, TR
MCLEAN, FB
论文数:
0
引用数:
0
h-index:
0
MCLEAN, FB
机构
:
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1988年
/ 35卷
/ 06期
关键词
:
D O I
:
10.1109/23.25437
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1186 / 1191
页数:6
相关论文
共 24 条
[21]
WINOKUR PS, 1982, IEEE T NUCL SCI, V29, P2102
[22]
CORRELATING THE RADIATION RESPONSE OF MOS CAPACITORS AND TRANSISTORS
[J].
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
;
SCHWANK, JR
论文数:
0
引用数:
0
h-index:
0
SCHWANK, JR
;
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, PJ
;
DRESSENDORFER, PV
论文数:
0
引用数:
0
h-index:
0
DRESSENDORFER, PV
;
TURPIN, DC
论文数:
0
引用数:
0
h-index:
0
TURPIN, DC
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1984,
31
(06)
:1453
-1460
[23]
THE NATURE OF THE DEEP HOLE TRAP IN MOS OXIDES
[J].
WITHAM, HS
论文数:
0
引用数:
0
h-index:
0
WITHAM, HS
;
LENAHAN, PM
论文数:
0
引用数:
0
h-index:
0
LENAHAN, PM
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1987,
34
(06)
:1147
-1151
[24]
HOLE TRAPS IN SILICON DIOXIDE
[J].
WOODS, MH
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
WOODS, MH
;
WILLIAMS, R
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
WILLIAMS, R
.
JOURNAL OF APPLIED PHYSICS,
1976,
47
(03)
:1082
-1089
←
1
2
3
→
共 24 条
[21]
WINOKUR PS, 1982, IEEE T NUCL SCI, V29, P2102
[22]
CORRELATING THE RADIATION RESPONSE OF MOS CAPACITORS AND TRANSISTORS
[J].
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
;
SCHWANK, JR
论文数:
0
引用数:
0
h-index:
0
SCHWANK, JR
;
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, PJ
;
DRESSENDORFER, PV
论文数:
0
引用数:
0
h-index:
0
DRESSENDORFER, PV
;
TURPIN, DC
论文数:
0
引用数:
0
h-index:
0
TURPIN, DC
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1984,
31
(06)
:1453
-1460
[23]
THE NATURE OF THE DEEP HOLE TRAP IN MOS OXIDES
[J].
WITHAM, HS
论文数:
0
引用数:
0
h-index:
0
WITHAM, HS
;
LENAHAN, PM
论文数:
0
引用数:
0
h-index:
0
LENAHAN, PM
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1987,
34
(06)
:1147
-1151
[24]
HOLE TRAPS IN SILICON DIOXIDE
[J].
WOODS, MH
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
WOODS, MH
;
WILLIAMS, R
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
WILLIAMS, R
.
JOURNAL OF APPLIED PHYSICS,
1976,
47
(03)
:1082
-1089
←
1
2
3
→