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SUCCESSIVE ELECTRONMICROSCOPIC OBSERVATION OF COLOURED AND BLEACHED KCI CRYSTAL

被引：13
作者：
HIBI, T
YADA, K
机构：
来源：
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1959年 / 14卷 / 04期
关键词：
D O I：
10.1143/JPSJ.14.455
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：455 / 463
页数：9
相关论文
共 7 条
[1]   A METHOD OF EXAMINING SELECTED AREAS OF SURFACES USING REPLICAS AND THE ELECTRON MICROSCOPE [J].
BOOKER, GR .
BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (OCT) :349-350
[2]   A SIMPLE ADAPTATION OF THE CARBON REPLICA TECHNIQUE FOR THE EXAMINATION OF SELECTED AREAS IN THE ELECTRON MICROSCOPE [J].
BRADLEY, DE .
BRITISH JOURNAL OF APPLIED PHYSICS, 1955, 6 (12) :430-432
[3]   METHOD FOR MAKING SUCCESSIVE REPLICAS OF THE SAME SPOT [J].
FOURIE, JT .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (04) :608-610
[4]   ELECTRONMICROSCOPIC OBSERVATION OF COLOURED AND BLEACHED ALKALI-HALIDE CRYSTALS [J].
HIBI, T ;
ISHIKAWA, K .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1958, 13 (07) :709-716
[5]  
HIBI T, UNPUBLISHED
[6]   A METHOD FOR THE ELECTRON AND OPTICAL MICROSCOPIC EXAMINATION OF IDENTICAL AREAS [J].
HYAM, ED ;
NUTTING, J .
BRITISH JOURNAL OF APPLIED PHYSICS, 1952, 3 (JUN) :173-176
[7]   A METHOD OF OBSERVING SELECTED AREAS IN ELECTRON AND OPTICAL MICROSCOPES [J].
NANKIVELL, JF .
BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (MAY) :141-143
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