AN AES STUDY OF DAMAGE INDUCED BY INERT-GAS IONS AT SIO2 SURFACES - INFLUENCE OF ION MASS AND ENERGY

被引:4
作者
KHELLAFI, M [1 ]
LANG, B [1 ]
机构
[1] UNIV STRASBOURG 1,EHICS,INST PHYS & CHIM MAT,SURFACES INTERFACES GRP,CNRS,F-67070 STRASBOURG,FRANCE
来源
REVUE DE PHYSIQUE APPLIQUEE | 1990年 / 25卷 / 04期
关键词
D O I
10.1051/rphysap:01990002504038900
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:389 / 394
页数:6
相关论文
共 25 条
[21]   MODIFICATION OF SIO THROUGH ROOM-TEMPERATURE PLASMA TREATMENTS, RAPID THERMAL ANNEALINGS, AND LASER IRRADIATION IN A NONOXIDIZING ATMOSPHERE [J].
ROCHET, F ;
DUFOUR, G ;
ROULET, H ;
PELLOIE, B ;
PERRIERE, J ;
FOGARASSY, E ;
SLAOUI, A ;
FROMENT, M .
PHYSICAL REVIEW B, 1988, 37 (11) :6468-6477
[22]   STUDY OF SPUTTERING EFFECTS IN OXIDES AND METAL-ADSORBED-GAS SYSTEMS USING COMBINED ANALYTICAL TECHNIQUES [J].
TAGLAUER, E ;
HEILAND, W ;
MACDONALD, RJ .
SURFACE SCIENCE, 1979, 90 (02) :661-675
[23]   SPUTTERING OF SILICON DIOXIDE NEAR THRESHOLD [J].
TODOROV, SS ;
FOSSUM, ER .
APPLIED PHYSICS LETTERS, 1988, 52 (05) :365-367
[24]   SPUTTERING OF CHEMISORBED GAS (NITROGEN ON TUNGSTEN) BY LOW-ENERGY IONS [J].
WINTERS, HF ;
SIGMUND, P .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) :4760-4766
[25]   SECONDARY ION MASS-SPECTROMETRY AS A MEANS OF SURFACE-ANALYSIS [J].
WITTMAACK, K .
SURFACE SCIENCE, 1979, 89 (1-3) :668-700