ACQUISITION, STORAGE, DISPLAY AND PROCESSING SYSTEM FOR ELECTRON ENERGY-LOSS SPECTRA

被引：11

作者：

EGERTON, RF

KENWAY, D

机构：

[1] Physics Department, University of Alberta, Edmonton

来源：

ULTRAMICROSCOPY | 1979年 / 4卷 / 02期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/S0304-3991(79)90247-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

An electronic recording system is described which can be used in conjunction with a transmission electron microscope fitted with an electron spectrometer. The system is based on a Texas Instruments 990/4 microcomputer and TI 733 data terminal. The minicomputer is programmed from a cassette tape which contains the software necessary for acquiring spectral data, displaying the spectra on a cathode ray tube and simple data processing. The latter includes performing a least-squares fit to a power-law energy dependence, which is used for stripping the background contribution from inner shell losses for quantitative microanalysis of light elements. © 1979 North-Holland Publishing Company.

引用

页码：221 / 225

页数：5

共 6 条

[1] CONTRIBUTION OF ELECTRON-ENERGY LOSS SPECTROSCOPY TO DEVELOPMENT OF ANALYTICAL ELECTRON-MICROSCOPY [J].

COLLIEX, C ;

COSSLETT, VE ;

LEAPMAN, RD ;

TREBBIA, P .

ULTRAMICROSCOPY, 1976, 1 (04) :301-315

[2] SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE [J].

EGERTON, RF .

ULTRAMICROSCOPY, 1978, 3 (01) :39-47

[3] FORMULAS FOR LIGHT-ELEMENT MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROMETRY [J].

EGERTON, RF .

ULTRAMICROSCOPY, 1978, 3 (02) :243-251

[4] INELASTIC-SCATTERING OF 80 KEV ELECTRONS IN AMORPHOUS CARBON [J].

EGERTON, RF .

PHILOSOPHICAL MAGAZINE, 1975, 31 (01) :199-215

[5] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J].

ISAACSON, M ;

JOHNSON, D .

ULTRAMICROSCOPY, 1975, 1 (01) :33-52

[6]

MAHER D, 1978, 13TH P ANN C MICR AN

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