RESOLUTION, OVERLAY, AND FIELD SIZE FOR LITHOGRAPHY SYSTEMS

被引:24
作者
BROERS, AN
机构
关键词
D O I
10.1109/T-ED.1981.20599
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1268 / 1278
页数:11
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  • [1] EXPERIMENTELLE BESTIMMUNG DER ENERGIEVERTEILUNG IN THERMISCH AUSGELOSTEN ELEKTRONENSTRAHLEN
    BOERSCH, H
    [J]. ZEITSCHRIFT FUR PHYSIK, 1954, 139 (02): : 115 - 146
  • [2] ELECTRON-BEAM PROXIMITY PRINTING - MASK LIFE INVESTIGATIONS
    BOHLEN, H
    GRESCHNER, J
    NEHMIZ, P
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06): : 1834 - 1837
  • [3] BOWDEN MJ, 1979, SOLID STATE TECHNOL, V22, P72
  • [4] ELECTRON-BEAM FABRICATION OF 80-A METAL STRUCTURES
    BROERS, AN
    MOLZEN, WW
    CUOMO, JJ
    WITTELS, ND
    [J]. APPLIED PHYSICS LETTERS, 1976, 29 (09) : 596 - 598
  • [6] BROERS AN, 1972, 5TH P INT C EL ION B, P3
  • [7] BROERS AN, 1980, 9TH P INT C EL ION B, P396
  • [8] BROERS AN, 1978, 9TH P INT C EL MICR, V3, P343
  • [9] CAHEN O, 1972, 4TH P INT C EL ION B, P92
  • [10] CHANG THP, 1976, 7TH P INT C EL ION B, P377