ELLIPSOMETRIC INVESTIGATION OF ELECTROOPTIC AND ELECTROSTRICTIVE EFFECTS IN ANODIC TA2O5 FILMS

被引：34

作者：

CORNISH, WD ^{[1
]}

YOUNG, L ^{[1
]}

机构：

[1] UNIV BRITISH COLUMBIA,ELECT ENGN DEPT,VANCOUVER 8,BRITISH COLUMBI,CANADA

来源：

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 1973年 / 335卷 / 1600期

关键词：

D O I：

10.1098/rspa.1973.0112

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：39 / 50

页数：12

共 16 条

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CHEN, FS
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) : 3389 - &
[2] DELLOCA CJ, 1970, J ELECTROCHEM SOC, V117, P1545, DOI [10.1149/1.2407379, 10.1149/1.2407380]
[3] DELLOCA CJ, 1971, PHYSICS THIN FILMS, V6
[4] DIGNAM MJ, 1972, ANODIC BEHAVIOR META, V1
[5] ENGELSEN DD, 1971, J OPT SOC AM, V61, P1460
[6] ELECTRIC-FIELD-INDUCED SHIFT OF INTERFERENCE PEAKS OF THIN TANTALUM OXIDE FILMS
FROVA, A
MIGLIORA.P
[J]. APPLIED PHYSICS LETTERS, 1968, 13 (09) : 328 - &
[7] ELECTRO-OPTIC EFFECT AND MODULATED INTERFERENCE IN TANTALUM OXIDE FILMS
FROVA, A
MIGLIORATO, P
[J]. APPLIED PHYSICS LETTERS, 1969, 15 (12) : 406 - +
[8] MEASUREMENT OF ANODIC OXIDE FILM THICKNESS BY ELECTROREFLECTANCE INTERFEROMETRY
HOLDEN, BJ
ULLMAN, FG
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (02) : 280 - &
[9] HOLDEN BJ, 1967, B AM PHYS SOC, V12, P1132
[10] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY
MCCRACKIN, FL
PASSAGLIA, E
STROMBERG, RR
STEINBERG, HL
[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +