PHOTOELECTRON AND INVERSE PHOTOELECTRON-SPECTROSCOPY STUDIES OF THE SI(111) SQUARE-ROOT-3XSQUARE-ROOT-3-SB SURFACE

被引：34

作者：

KINOSHITA, T ^{[1
]}

ENTA, Y ^{[1
]}

OHTA, H ^{[1
]}

YAEGASHI, Y ^{[1
]}

SUZUKI, S ^{[1
]}

KONO, S ^{[1
]}

机构：

[1] TOHOKU UNIV,FAC SCI,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN

来源：

SURFACE SCIENCE | 1988年 / 204卷 / 03期

关键词：

D O I：

10.1016/0039-6028(88)90222-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：405 / 414

页数：10

共 18 条

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[7] ANGLE-RESOLVED ULTRAVIOLET PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(111) SQUARE-ROOT-3X SQUARE-ROOT-3-BI SURFACE [J].

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[8] EMPTY-ELECTRONIC AND FILLED-ELECTRONIC STATES OF THE SI(111)-SQUARE-ROOT-3 X SQUARE-ROOT-3-SN, SQUARE-ROOT-3 X SQUARE-ROOT-3-IN AND 2-SQUARE-ROOT-3 X 2-SQUARE-ROOT-3-SN SURFACES [J].

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[9] LOW-ENERGY ELECTRON-DIFFRACTION AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF THE FORMATION OF SUBMONOLAYER INTERFACES OF SB/SI(111) [J].

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