SECONDARY NEUTRAL MASS-SPECTROMETRY (SNMS)-RECENT METHODICAL PROGRESS AND APPLICATIONS TO FUNDAMENTAL-STUDIES IN PARTICLE SURFACE INTERACTION

被引:44
作者
OECHSNER, H
机构
[1] Institut für Oberflächen- und Schichtanalytik IFOS, Universität Kaiserslautern, D-67663 Kaiserslautern, Erwin-Schrödinger-Straße
来源
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1995年 / 143卷
关键词
MICROANALYSIS; QUANTITATIVE SURFACE AND THIN FILM ANALYSIS; SINGLE-CRYSTAL SPUTTERING; SPUTTER GENERATED MOLECULES;
D O I
10.1016/0168-1176(94)04122-N
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Recent instrumental developments of the conventional secondary neutral mass spectrometry (SNMS) technique based on electron gas post-ionization are described with regard to its application to non-conducting samples and its implementation in a novel secondary neutral microprobe. The use of molecular SNMS signals for quantitative surface analysis, and a standard free technique for absolute depth calibration from the mass spectrometric signals are discussed and elucidated by appropriate examples. Finally, some applications of electron gas SNMS to fundamental studies on low energy particle/surface interaction are presented.
引用
收藏
页码:271 / 282
页数:12
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