共 9 条
[5]
信号处理滤波器设计[M]. 电子工业出版社[美]MiroslavD.Lutovac等著, 2004
[6]
A sample scanning system with nanometric accuracy for quantitative SPM measurements[J] . G.B Picotto,M Pisani.Ultramicroscopy . 2001 (1)
[7]
The long-range scanning stage: a novel platform for scanned-probe microscopy[J] . Mike Holmes,Robert Hocken,David Trumper.Precision Engineering . 2000 (3)
[8]
A metrological scanning force microscope used for coating thickness and other topographical measurements[J] . M. Bienias,S. Gao,K. Hasche,R. Seemann,K. Thiele.Applied Physics A Materials Science & Processing . 1998 (1)
[9]
Dimensional Metrology with the NIST Calibrated Atomic Force Microscope .2 R. Dixson,R. K¨oning,V.W. Tsai,J. Fu,T.V. Vorburger. Proc.SPIE . 1999