Nanofocusing parabolic refractive x-ray lenses

被引:150
作者
Schroer, CG [1 ]
Kuhlmann, M
Hunger, UT
Günzler, TF
Kurapova, O
Feste, S
Frehse, F
Lengeler, B
Drakopoulos, M
Somogyi, A
Simionovici, AS
Snigirev, A
Snigireva, I
Schug, C
Schröder, WH
机构
[1] Univ Aachen, Inst Phys 2, D-52056 Aachen, Germany
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[3] IBM Deutschland Speichersyst GmbH, D-55131 Mainz, Germany
[4] Forschungszentrum Julich, Inst Pytosphare ICGIII, D-52425 Julich, Germany
关键词
D O I
10.1063/1.1556960
中图分类号
O59 [应用物理学];
学科分类号
摘要
Parabolic refractive x-ray lenses with short focal distance can generate intensive hard x-ray microbeams with lateral extensions in the 100 nm range even at a short distance from a synchrotron radiation source. We have fabricated planar parabolic lenses made of silicon that have a focal distance in the range of a few millimeters at hard x-ray energies. In a crossed geometry, two lenses were used to generate a microbeam with a lateral size of 380 nm by 210 nm at 25 keV in a distance of 42 m from the synchrotron radiation source. Using diamond as the lens material, microbeams with a lateral size down to 20 nm and below are conceivable in the energy range from 10 to 100 keV. (C) 2003 American Institute of Physics.
引用
收藏
页码:1485 / 1487
页数:3
相关论文
共 15 条
[1]   X-ray refractive planar lens with minimized absorption [J].
Aristov, V ;
Grigoriev, M ;
Kuznetsov, S ;
Shabelnikov, L ;
Yunkin, V ;
Weitkamp, T ;
Rau, C ;
Snigireva, I ;
Snigirev, A ;
Hoffmann, M ;
Voges, E .
APPLIED PHYSICS LETTERS, 2000, 77 (24) :4058-4060
[2]   X-ray focusing by planar parabolic refractive lenses made of silicon [J].
Aristov, VV ;
Grigoriev, MV ;
Kuznetsov, SM ;
Shabelnikov, LG ;
Yunkin, VA ;
Hoffmann, M ;
Voges, E .
OPTICS COMMUNICATIONS, 2000, 177 (1-6) :33-38
[3]   NANOMETER SPATIAL-RESOLUTION ACHIEVED IN HARD X-RAY-IMAGING AND LAUE DIFFRACTION EXPERIMENTS [J].
BILDERBACK, DH ;
HOFFMAN, SA ;
THIEL, DJ .
SCIENCE, 1994, 263 (5144) :201-203
[4]   Synchrotron hard x-ray microprobe:: Fluorescence imaging of single cells [J].
Bohic, S ;
Simionovici, A ;
Snigirev, A ;
Ortega, R ;
Devès, G ;
Heymann, D ;
Schroer, CG .
APPLIED PHYSICS LETTERS, 2001, 78 (22) :3544-3546
[5]   X-ray microdiffraction images of antiferromagnetic domain evolution in chromium [J].
Evans, PG ;
Isaacs, ED ;
Aeppli, G ;
Cai, Z ;
Lai, B .
SCIENCE, 2002, 295 (5557) :1042-1045
[6]   Submicron focusing of hard X-rays with reflecting surfaces at the ESRF [J].
Hignette, O ;
Rostaing, G ;
Cloetens, P ;
Rommeveaux, A ;
Ludwig, W ;
Freund, A .
X-RAY MICRO- AND NANO-FOCUSING: APPLICATIONS AND TECHNIQUES II, 2001, 4499 :105-116
[7]   Kirkpatrick-Baez optics for a sub-mu m synchrotron X-ray microbeam and its applications to X-ray analysis [J].
Iida, A ;
Hirano, K .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 114 (1-2) :149-153
[8]   Hard X-ray microbeam experiments with a sputtered-sliced Fresnel zone plate and its applications [J].
Kamijo, N ;
Suzuki, Y ;
Awaji, M ;
Takeuchi, A ;
Takano, H ;
Ninomiya, T ;
Tamura, S ;
Yasumoto, M .
JOURNAL OF SYNCHROTRON RADIATION, 2002, 9 :182-186
[9]   Imaging by parabolic refractive lenses in the hard X-ray range [J].
Lengeler, B ;
Schroer, C ;
Tümmler, J ;
Benner, B ;
Richwin, M ;
Snigirev, A ;
Snigireva, I ;
Drakopoulos, M .
JOURNAL OF SYNCHROTRON RADIATION, 1999, 6 :1153-1167
[10]   A microscope for hard x rays based on parabolic compound refractive lenses [J].
Lengeler, B ;
Schroer, CG ;
Richwin, M ;
Tümmler, J ;
Drakopoulos, M ;
Snigirev, A ;
Snigireva, I .
APPLIED PHYSICS LETTERS, 1999, 74 (26) :3924-3926