共 12 条
[1]
CALIBRATION REQUIREMENTS FOR MIRAU AND LINNIK MICROSCOPE INTERFEROMETERS
[J].
APPLIED OPTICS,
1989, 28 (11)
:1972-1974
[2]
BRUCE CF, 1956, J SCI INSTRUM, V34, P203
[4]
Creath K., 1988, Progress in optics. Vol.XXVI, P349, DOI 10.1016/S0079-6638(08)70178-1
[5]
FRINGE SPACING IN INTERFERENCE MICROSCOPES
[J].
JOURNAL OF SCIENTIFIC INSTRUMENTS,
1956, 33 (12)
:507-507
[8]
ANGSTROM RESOLUTION OPTICAL PROFILOMETRY FOR MICROSCOPIC OBJECTS
[J].
APPLIED OPTICS,
1987, 26 (11)
:2245-2249
[9]
ELECTROMAGNETIC DIFFRACTION IN OPTICAL SYSTEMS .2. STRUCTURE OF THE IMAGE FIELD IN AN APLANATIC SYSTEM
[J].
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES,
1959, 253 (1274)
:358-379