The ion energy distributions and ion flux composition from a high power impulse magnetron sputtering discharge

被引:294
作者
Bohlmark, J.
Lattemann, M.
Gudmundsson, J. T.
Ehiasarian, A. P.
Gonzalvo, Y. Aranda
Brenning, N.
Helmersson, U. [1 ]
机构
[1] Linkoping Univ, IFM Mat Phys, SE-58183 Linkoping, Sweden
[2] Chemfilt Ionsputtering AB, S-58335 Linkoping, Sweden
[3] Univ Iceland, Dept Elect & Comp Engn, IS-107 Reykjavik, Iceland
[4] Univ Iceland, Inst Sci, IS-107 Reykjavik, Iceland
[5] Sheffield Hallam Univ, Mat & Engn Res Inst, Sheffield S1 1WB, S Yorkshire, England
[6] Hiden Analyt Ltd, Warrington WA5 7UN, Cheshire, England
[7] Royal Inst Technol, Div Plasma Phys, Alfven Lab, SE-10044 Stockholm, Sweden
关键词
sputtering; HIPIMS; mass spectometry; plasma characterization;
D O I
10.1016/j.tsf.2006.04.051
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The energy distribution of sputtered and ionized metal atoms as well as ions from the sputtering gas is reported for a high power impulse magnetron sputtering (HIPIMS) discharge. High power pulses were applied to a conventional planar circular magnetron Ti target. The peak power on the target surface was 1-2 kW/cm(2) with a duty factor of about 0.5%. Time resolved, and time averaged ion energy distributions were recorded with an energy resolving quadrupole mass spectrometer. The ion energy distributions recorded for the HIPIMS discharge are broader with maximum detected energy of 100 eV and contain a larger fraction of highly energetic ions (about 50% with E-i > 20 eV) as compared to a conventional direct current magnetron sputtering discharge. The composition of the ion flux was also determined, and reveals a high metal fraction. During the most intense moment of the discharge, the ionic flux consisted of approximately 50% Ti1+, 24% Ti2+, 23% Ar1+, and 3% Ar2+ ions. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1522 / 1526
页数:5
相关论文
共 18 条
[1]  
[Anonymous], 2006, CRC HDB CHEM PHYS IN
[2]   Spatial electron density distribution in a high-power pulsed magnetron discharge [J].
Bohlmark, J ;
Gudmundsson, JT ;
Alami, J ;
Latteman, M ;
Helmersson, U .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 2005, 33 (02) :346-347
[3]   Ionization of sputtered metals in high power pulsed magnetron sputtering [J].
Bohlmark, J ;
Alami, J ;
Christou, C ;
Ehiasarian, AP ;
Helmersson, U .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2005, 23 (01) :18-22
[4]   Measurement of the plasma potential in a magnetron discharge and the prediction of the electron drift speeds [J].
Bradley, JW ;
Thompson, S ;
Gonzalvo, YA .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 2001, 10 (03) :490-501
[5]   Ionization of sputtered material in a planar magnetron discharge [J].
Christou, C ;
Barber, ZH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2000, 18 (06) :2897-2907
[6]  
DEKOVEN BM, 2003, P 46 ANN TECHN C SOC, P158
[7]   Comparison of microstructure and mechanical properties of chromium nitride-based coatings deposited by high power impulse magnetron sputtering and by the combined steered cathodic arc/unbalanced magnetron technique [J].
Ehiasarian, AP ;
Hovsepian, PE ;
Hultman, L ;
Helmersson, U .
THIN SOLID FILMS, 2004, 457 (02) :270-277
[8]   High power pulsed magnetron sputtered CrNx films [J].
Ehiasarian, AP ;
Münz, WD ;
Hultman, L ;
Helmersson, U ;
Petrov, I .
SURFACE & COATINGS TECHNOLOGY, 2003, 163 :267-272
[9]   Influence of high power densities on the composition of pulsed magnetron plasmas [J].
Ehiasarian, AP ;
New, R ;
Münz, WD ;
Hultman, L ;
Helmersson, U ;
Kouznetsov, V .
VACUUM, 2002, 65 (02) :147-154
[10]   Ion fraction and energy distribution of Ti flux incident to substrate surface in RF-plasma enhanced magnetron sputtering [J].
Fukushima, K ;
Kusano, E ;
Kikuchi, N ;
Saito, T ;
Saiki, S ;
Nanto, H ;
Kinbara, A .
VACUUM, 2000, 59 (2-3) :586-593