Direct determination of volatile elements in nickel alloys by electrothermal vaporization inductively coupled plasma mass spectrometry

被引:45
作者
Hinds, MW
Gregoire, DC
Ozaki, EA
机构
[1] GEOL SURVEY CANADA,OTTAWA,ON K1A 0E8,CANADA
[2] VILLARES MET SA,BR-13177900 SUMARE,SP,BRAZIL
关键词
electrothermal vaporization; inductively coupled plasma mass spectrometry; solid sample; nickel alloys; volatile elements;
D O I
10.1039/a603313j
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A method is described for the direct determination of Bi, Pb and Te in solid Ni alloys by ETV-ICP-MS. Samples are introduced into the graphite tube as small filings or chips weighing up to 3 mg, Using diluted sea water as a physical carrier, both Bi and Pb could be determined in solid Ni using external calibration with aqueous samples although results for Pb were biased low, Better results in terms of accuracy and precision were obtained when solid RMs (Ni) were used for calibration, LODs of 14 and 44 ng g(-1) were obtained for Bi and Ph, respectively, using a reduced sensitivity mode (OmniRange). Based on signals obtained for solution standards measured at the highest sensitivity, LODs of 0.002 and 0.004 ng g(-1) are possible for Bi and Pb, respectively, The determination of Te by this technique was not successful using either solution or solids calibration, Tellurium did not show a linear instrument response with concentration, which was probably due to an interaction between the Te and one or more matrix components in the solid phase that alters the release mechanism(s) for Te from those observed for Pb and Bi.
引用
收藏
页码:131 / 135
页数:5
相关论文
共 18 条
[11]   DIRECT SOLID SAMPLING OF NICKEL BASED ALLOYS BY GRAPHITE-FURNACE ATOMIC-ABSORPTION SPECTROMETRY WITH AQUEOUS CALIBRATION [J].
IRWIN, R ;
MIKKELSEN, A ;
MICHEL, RG ;
DOUGHERTY, JP ;
PRELI, FR .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1990, 45 (08) :903-915
[12]   DETERMINATION OF TELLURIUM AND ANTIMONY IN NICKEL-ALLOYS BY LASER-EXCITED ATOMIC FLUORESCENCE SPECTROMETRY IN A GRAPHITE-FURNACE [J].
LIANG, ZW ;
LONARDO, RF ;
MICHEL, RG .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1993, 48 (01) :7-23
[13]   ATOMIC-ABSORPTION DETERMINATION OF LEAD, BISMUTH, SELENIUM, TELLURIUM, THALLIUM AND TIN IN COMPLEX ALLOYS USING DIRECT ATOMIZATION FROM METAL CHIPS IN GRAPHITE FURNACE [J].
MARKS, JY ;
WELCHER, GG ;
SPELLMAN, RJ .
APPLIED SPECTROSCOPY, 1977, 31 (01) :9-11
[14]   SOLID SAMPLING ELECTROTHERMAL VAPORIZATION FOR SAMPLE INTRODUCTION IN INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY AND INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY [J].
MOENS, L ;
VERREPT, P ;
BOONEN, S ;
VANHAECKE, F ;
DAMS, R .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1995, 50 (4-7) :463-475
[15]   ASSESSMENT OF DIRECT SOLID SAMPLE ANALYSIS BY GRAPHITE PELLET ELECTROTHERMAL VAPORIZATION INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY [J].
REN, JM ;
RATTRAY, R ;
SALIN, ED ;
GREGOIRE, DC .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1995, 10 (11) :1027-1029
[16]   SOLID SAMPLING ELECTROTHERMAL VAPORIZATION INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY FOR THE DETERMINATION OF ARSENIC IN STANDARD REFERENCE MATERIALS OF PLANT-ORIGIN [J].
VANHAECKE, F ;
BOONEN, S ;
MOENS, L ;
DAMS, R .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1995, 10 (02) :81-87
[17]   Use of the Ar-2(+) signal as a diagnostic tool in solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry [J].
Vanhaecke, F ;
Galbacs, G ;
Boonen, S ;
Moens, L ;
Dams, R .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1995, 10 (12) :1047-1052
[18]   ANALYSIS OF SOLID SAMPLES BY ICP-MASS-SPECTROMETRY [J].
VOELLKOPF, U ;
PAUL, M ;
DENOYER, ER .
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1992, 342 (12) :917-923