Photoassisted scanning tunneling microscopy

被引:168
作者
Grafström, S [1 ]
机构
[1] Tech Univ Dresden, Inst Angew Photophys, D-01062 Dresden, Germany
关键词
D O I
10.1063/1.1432113
中图分类号
O59 [应用物理学];
学科分类号
摘要
The combination of scanning tunneling microscopy (STM) with optical excitation adds new information to STM. A review is presented covering the work done on light-induced effects in STM during the past 15 years. Effects discussed include thermal effects, nonlinear effects, field enhancement at the STM tip, various effects on semiconductor surfaces, excitation of surface plasmons, detection of photoelectrons, spin-polarized tunneling, as well as light-induced nanomodifications, local optical spectroscopy, the use of ultrashort laser pulses for time-resolved STM, and the combination of STM and scanning near-field optical microscopy. (C) 2002 American Institute of Physics.
引用
收藏
页码:1717 / 1753
页数:37
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