Isotropic dielectric functions of highly disordered AlxGa1-xInP (0≤x≤1) lattice matched to GaAs

被引:52
作者
Schubert, M [1 ]
Woollam, JA
Leibiger, G
Rheinländer, B
Pietzonka, I
Sass, T
Gottschalch, V
机构
[1] Univ Nebraska, Ctr Microelect & Opt Mat Res, Lincoln, NE 68588 USA
[2] Univ Nebraska, Dept Elect Engn, Lincoln, NE 68588 USA
[3] Univ Leipzig, Fac Phys & Geosci, Dept Semicond Phys, D-04103 Leipzig, Germany
[4] Univ Leipzig, Fac Chem & Mineral, Dept Solid State Chem, D-04103 Leipzig, Germany
关键词
D O I
10.1063/1.371003
中图分类号
O59 [应用物理学];
学科分类号
摘要
Determination of the complex dielectric function and the critical-point energies of (AlxGa1-x)(0.51)In0.49P, over the full range of composition x and for photon energies E from 0.75 to 5 eV is reported from variable angle of incidence spectroscopic ellipsometry. Native-oxide effects on the (AlxGa1-x)(0.51)In0.49P optical functions are removed numerically. The highly disordered state of the metalorganic vapor-phase epitaxy grown samples is analyzed by transmission electron microscopy. Optical anisotropy investigations revealed that the order-induced optical birefringence is negligible throughout. The augmentation of A. D. Rakic and M. L. Majewski [J. Appl. Phys. 80, 5909 (1996)] to Adachi's critical-point model, i.e., consideration of Gaussian-like broadening function instead of Lorentzian broadening, is used for calculation of the isotropic (AlxGa1-x)(0.51)In0.49P dielectric function is an element of. The optical functions spectra consistently match the experimental data, whereas previously reported model dielectric functions fail to reproduce the correct absorption behavior of the quaternary, especially near the fundamental band-to-band transition. The results are compared to those presented previously, and influence of spontaneous chemical ordering is discussed. (C) 1999 American Institute of Physics. [S0021-8979(99)04316-9].
引用
收藏
页码:2025 / 2033
页数:9
相关论文
共 42 条
[21]   MODELING THE OPTICAL DIELECTRIC FUNCTION OF SEMICONDUCTORS - EXTENSION OF THE CRITICAL-POINT PARABOLIC-BAND APPROXIMATION [J].
KIM, CC ;
GARLAND, JW ;
ABAD, H ;
RACCAH, PM .
PHYSICAL REVIEW B, 1992, 45 (20) :11749-11767
[22]   ATOMIC ARRANGEMENT OF SPONTANEOUSLY ORDERED AL0.5IN0.5P/GAAS [J].
KONDOW, M ;
KAKIBAYASHI, H ;
MINAGAWA, S .
PHYSICAL REVIEW B, 1989, 40 (02) :1159-1163
[23]   STUDY OF STRAIN AND DISORDER OF INXGA1-XP (GAAS, GRADED GAP) (0.25-LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.8) USING SPECTROSCOPIC ELLIPSOMETRY AND RAMAN-SPECTROSCOPY [J].
LEE, H ;
BISWAS, D ;
KLEIN, MV ;
MORKOC, H ;
ASPNES, DE ;
CHOE, BD ;
KIM, J ;
GRIFFITHS, CO .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (10) :5040-5051
[24]   OPTICAL STUDY OF (ALXGA1-X)0.5IN0.5P/GAAS SEMICONDUCTOR ALLOYS BY SPECTROSCOPIC ELLIPSOMETRY [J].
LEE, H ;
KLEIN, MV ;
ASPNES, DE ;
KUO, CP ;
PEANASKY, M ;
CRAFORD, MG .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (01) :400-406
[25]   CuPt-type ordering and dopant effect of In0.5Ga0.5-P/GaAs using spectroscopic ellipsometry [J].
Lee, H ;
Klein, MV ;
Olson, JM ;
Hsieh, KC .
PHYSICAL REVIEW B, 1996, 53 (07) :4015-4022
[26]   OPTICAL ANISOTROPY AND SPONTANEOUS ORDERING IN GA0.5IN0.5P - AN INVESTIGATION USING REFLECTANCE-DIFFERENCE SPECTROSCOPY [J].
LUO, JS ;
OLSON, JM ;
KURTZ, SR ;
ARENT, DJ ;
BERTNESS, KA ;
RAIKH, ME ;
TSIPER, EV .
PHYSICAL REVIEW B, 1995, 51 (12) :7603-7612
[27]   Near-band-gap reflectance anisotropy in ordered Ga0.5In0.5P [J].
Luo, JS ;
Olson, JM ;
Zhang, Y ;
Mascarenhas, A .
PHYSICAL REVIEW B, 1997, 55 (24) :16385-16389
[28]   REFRACTIVE-INDEX OF (ALXGA1-X)(0.5)IN0.5P GROWN BY METALORGANIC VAPOR-PHASE EPITAXY [J].
MOSER, M ;
WINTERHOFF, R ;
GENG, C ;
QUEISSER, I ;
SCHOLZ, F ;
DORNEN, A .
APPLIED PHYSICS LETTERS, 1994, 64 (02) :235-237
[29]   Ellipsometric and thermoreflectance spectra of (AlxGa1-x)(0.5)In0.5P alloys [J].
Ozaki, S ;
Adachi, S ;
Sato, M ;
Ohtsuka, K .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (01) :439-445
[30]   Modeling the optical dielectric function of GaAs and AlAs: Extension of Adachi's model [J].
Rakic, AD ;
Majewski, ML .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (10) :5909-5914