Comparison of strong coupling regimes in bulk GaAs, GaN, and ZnO semiconductor microcavities

被引:50
作者
Faure, S. [1 ]
Guillet, T.
Lefebvre, P.
Bretagnon, T.
Gil, B.
机构
[1] Univ Montpellier 2, Etud Semicond Grp, F-34095 Montpellier 5, France
来源
PHYSICAL REVIEW B | 2008年 / 78卷 / 23期
关键词
excitons; gallium arsenide; gallium compounds; III-V semiconductors; II-VI semiconductors; microcavities; polaritons; Q-factor; reflectivity; Rydberg states; valence bands; wide band gap semiconductors; zinc compounds;
D O I
10.1103/PhysRevB.78.235323
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Wide band-gap semiconductors are attractive candidates for polariton-based devices operating at room temperature. We present numerical simulations of reflectivity, transmission, and absorption spectra of bulk GaAs, GaN, and ZnO microcavities in order to compare the particularities of the strong coupling regime in each system. Indeed the intrinsic properties of the excitons in these materials result in a different hierarchy of energies among the valence-band splitting, the effective Rydberg, and the Rabi energy, defining the characteristics of the exciton-polariton states independent of the quality factor of the cavity. Knowledge of the composition of the polariton eigenstates is central to optimize such systems. We demonstrate that in ZnO bulk microcavities, only the lower polaritons are good eigenstates and all other resonances are damped, whereas upper polaritons can be properly defined in GaAs and GaN microcavities.
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页数:7
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