Three-point bending Young's modulus of nanowires

被引：25

作者：

Zhou, Ping ^{[1
]}

Wu, Chengwei ^{[1
]}

Li, Xiaodong ^{[2
]}

机构：

[1] Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China

[2] Univ S Carolina, Dept Mech Engn, Columbia, SC 29208 USA

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 2008年 / 19卷 / 11期

基金：

中国国家自然科学基金; 美国国家科学基金会;

关键词：

Young's modulus; three-point bending; nanowires;

D O I：

10.1088/0957-0233/19/11/115703

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The three-point bending Young's modulus (E) of nanowires was studied by a finite element method. It was found that the constraint conditions at the nanowire ends, the ratio of the suspended length of the wire to the wire diameter and the deflection of the wire all work together to contribute to the measurement errors of the Young's modulus. Yielding of the deposited material used to fix the nanowire ends leads to a decrease in the slope of the load-deflection curve. The three-point bending criteria for nanowires have been established. A modified equation for the measurement of the three- point bending Young's modulus of nanowires is proposed.

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