''Universal'' dependence of avalanche breakdown on bandstructure: Choosing materials for high-power devices

被引:30
作者
Allam, J
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 3B期
关键词
avalanche breakdown; impact ionisation; universal formula; Penn gap; special points;
D O I
10.1143/JJAP.36.1529
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new simple phenomenological relation between the breakdown voltage V-b and the bandstructure in semiconductor junctions is presented. For narrow-gap semiconductors, V-b scales with the minimum energy gap (E(g)) as has been previously reported. However, for wide-gap materials including GaAs, InP, etc., V-b is linearly dependent on [E], a Brillouin-zone-averaged energy gap. Values of [E] are determined from accurate quasi-particle bandstructures for 25 tetrahedral semiconductors. We discuss the origin of this relation and the role of the ionisation probability and electron-phonon scattering rate. The relation can be used to predict the breakdown voltage in semiconductors and semiconductor alloys.
引用
收藏
页码:1529 / 1542
页数:14
相关论文
共 51 条
[1]  
ADACHI S, 1993, EMIS DATA REV, V7
[2]   IMPACT IONIZATION IN GAAS - DISTRIBUTION OF FINAL ELECTRON-STATES DETERMINED FROM HYDROSTATIC-PRESSURE MEASUREMENTS [J].
ALLAM, J ;
ADAMS, AR ;
PATE, MA ;
ROBERTS, JS .
APPLIED PHYSICS LETTERS, 1995, 67 (22) :3304-3306
[3]  
ALLAM J, 1992, HIGH PRESSURE RES, V9, P231
[4]  
Allam J., 1990, I PHYS C SER, V112, P375
[5]  
ANDERSON CL, 1972, PHYS REV B, V5, P2667
[6]   THRESHOLDS OF IMPACT IONIZATION IN SEMICONDUCTORS [J].
BUDE, J ;
HESS, K .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (08) :3554-3561
[7]   IMPACT IONIZATION IN SEMICONDUCTORS - EFFECTS OF HIGH ELECTRIC-FIELDS AND HIGH SCATTERING RATES [J].
BUDE, J ;
HESS, K ;
IAFRATE, GJ .
PHYSICAL REVIEW B, 1992, 45 (19) :10958-10964
[8]   MEASUREMENT OF THE ELECTRON IONIZATION COEFFICIENT AT LOW ELECTRIC-FIELDS IN INGAAS-BASED HETEROJUNCTION BIPOLAR-TRANSISTORS [J].
CANALI, C ;
FORZAN, C ;
NEVIANI, A ;
VENDRAME, L ;
ZANONI, E ;
HAMM, RA ;
MALIK, RJ ;
CAPASSO, F ;
CHANDRASEKHAR, S .
APPLIED PHYSICS LETTERS, 1995, 66 (09) :1095-1097
[9]  
CAPASSO F, 1986, SEMICONDUCTORS SEM D, V22, P1
[10]   ACOUSTIC DEFORMATION POTENTIALS AND HETEROSTRUCTURE BAND OFFSETS IN SEMICONDUCTORS [J].
CARDONA, M ;
CHRISTENSEN, NE .
PHYSICAL REVIEW B, 1987, 35 (12) :6182-6194