Radio-frequency single-electron transistor: Toward the shot-noise limit

被引:81
作者
Aassime, A
Gunnarsson, D
Bladh, K
Delsing, P
Schoelkopf, R
机构
[1] Chalmers Univ Technol, Dept Microelect & Nanosci, S-41296 Gothenburg, Sweden
[2] Gothenburg Univ, S-41296 Gothenburg, Sweden
[3] Yale Univ, Dept Phys & Appl Phys, New Haven, CT 06520 USA
关键词
D O I
10.1063/1.1424477
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have fabricated an aluminum single-electron transistor and characterized it at frequencies up to 10 MHz by measuring the reflected signal from a resonant tank in which the transistor is embedded. We measured the charge sensitivity of this radio-frequency single-electron transistor to be 3.2x10(-6) e/root Hz, which corresponds to the uncoupled energy sensitivity of 4.8 (h) over bar. Our measurements indicate that with further improvements, the radio-frequency single-electron transistor could reach the shot-noise limit estimated to be about 1 (h) over bar. (C) 2001 American Institute of Physics.
引用
收藏
页码:4031 / 4033
页数:3
相关论文
共 15 条
  • [1] Radio-frequency single-electron transistor as readout device for qubits: Charge sensitivity and backaction
    Aassime, A
    Johansson, G
    Wendin, G
    Schoelkopf, RJ
    Delsing, P
    [J]. PHYSICAL REVIEW LETTERS, 2001, 86 (15) : 3376 - 3379
  • [2] AVERIN DV, 1991, MESOSCOPIC PHENOMENA, P71
  • [3] SHOT-NOISE SUPPRESSION IN THE SINGLE-ELECTRON TUNNELING REGIME
    BIRK, H
    DEJONG, MJM
    SCHONENBERGER, C
    [J]. PHYSICAL REVIEW LETTERS, 1995, 75 (08) : 1610 - 1613
  • [4] Amplifying quantum signals with the single-electron transistor
    Devoret, MH
    Schoelkopf, RJ
    [J]. NATURE, 2000, 406 (6799) : 1039 - 1046
  • [5] Charge noise analysis of an AlGaAs/GaAs quantum dot using transmission-type radio-frequency single-electron transistor technique
    Fujisawa, T
    Hirayama, Y
    [J]. APPLIED PHYSICS LETTERS, 2000, 77 (04) : 543 - 545
  • [6] OBSERVATION OF SINGLE-ELECTRON CHARGING EFFECTS IN SMALL TUNNEL-JUNCTIONS
    FULTON, TA
    DOLAN, GJ
    [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (01) : 109 - 112
  • [7] GRABERT H, 1992, NATO ASI B, V279, P74
  • [8] Single-spin measurement using single-electron transistors to probe two-electron systems
    Kane, BE
    McAlpine, NS
    Dzurak, AS
    Clark, RG
    Milburn, GJ
    Sun, HB
    Wiseman, H
    [J]. PHYSICAL REVIEW B, 2000, 61 (04): : 2961 - 2972
  • [9] INTRINSIC NOISE OF THE SINGLE-ELECTRON TRANSISTOR
    KOROTKOV, AN
    [J]. PHYSICAL REVIEW B, 1994, 49 (15): : 10381 - 10392
  • [10] Charge sensitivity of radio frequency single-electron transistor
    Korotkov, AN
    Paalanen, MA
    [J]. APPLIED PHYSICS LETTERS, 1999, 74 (26) : 4052 - 4054