Polarization effects in nitride semiconductors and device structures

被引:18
作者
Morkoç, H
Cingolani, R
Gil, B
机构
[1] Virginia Commonwealth Univ, Coll Engn, Richmond, VA 23284 USA
[2] Virginia Commonwealth Univ, Dept Phys, Richmond, VA 23284 USA
[3] Univ Montpellier 2, F-34095 Montpellier 5, France
关键词
GaN; semiconductor nitrides; spontaneous polarization; strain; piezoelectric polarization; AlGaN heterostructures; AlGaN/GaN MODFETs;
D O I
10.1007/s100190050132
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Wide bandgap nitride semiconductors have recently attracted a great level of attention owing to their direct bandgaps in the visible to ultraviolet regions of the spectrum as emitters and detectors. Moreover, this material system with its favorable hetero-junctions and transport properties began to produce very respectable power levels in microwave amplifiers. If and when the breakdown fields achieved experimentally approach the predicted values, this material system would also be very attractive for power switching devices. In addition to the premature breakdown, high concentration of defects, and inhomogeneities, a number of scientific challenges remain including a clear experimental investigation of polarization effects. In this paper, following a succinct review of the progress that has been made, spontaneous and piezoelectric polarization effects and their impact on sample device-like hetero-structures will be treated.
引用
收藏
页码:97 / 106
页数:10
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