Fermi level shift in La2-xSrxCuO4 probed by heteroepitaxial junctions with Nb-doped SrTiO3

被引:11
作者
Li, B. -S. [1 ,2 ,3 ]
Sawa, A. [3 ]
Okamoto, H. [2 ]
机构
[1] Harbin Inst Technol HIT, Acad Fundamental & Interdisciplinary Sci, Harbin 150080, Peoples R China
[2] Univ Tokyo, Dept Adv Mat Sci, Kashiwa, Chiba 2778561, Japan
[3] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058562, Japan
关键词
D O I
10.1063/1.4798252
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated Fermi-level shifts with carrier doping in La2-xSrxCuO4 (LSCO) (x = 0-0.35) by using heteroepitaxial junctions with Nb-doped SrTiO3. The junctions showed highly rectifying current-voltage characteristics, in accord with the conventional theory of a Schottky or p-n diode. For x = 0-0.20, the built-in potential increased with increase of x, indicating the downward shift of the Fermi-level in La2-xSrxCuO4. The Fermi-level shift however reversed to upward at x similar to 0.20. This behavior is related to the electronic-structure change, which is characterized by the reversal of dominant carrier type from hole to electron in overdoped La2-xSrxCuO4 confirmed by Hall measurements. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4798252]
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页数:4
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