Ge Si self-assembled quantum dots grown on Si(001) in an industrial high-pressure chemical vapor deposition reactor

被引:22
作者
Hernandez, C
Campidelli, Y
Simon, D
Bensahel, D
Sagnes, I
Patriarche, G
Boucaud, P
Sauvage, S
机构
[1] France Telecom, Ctr Natl Etud Telecommun, CNS, F-38243 Meylan, France
[2] France Telecom, CNET, F-92225 Bagneux, France
[3] Univ Paris Sud, Inst Elect Fondamentale, CNRS, URA 22, F-91405 Orsay, France
关键词
D O I
10.1063/1.370856
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the structural and optical properties of Ge/Si self-assembled quantum dots epitaxially grown on Si(001). The Ge islands are grown in an industrial 200 mm single-wafer chemical vapor deposition reactor. The surface density of the Ge islands is as much as 2x10(10) cm(-2). The islands exhibit a maximum photoluminescence at 1.55 mu m wavelength. The photoluminescence energy is correlated to the three-dimensional quantum confinement energy and to the size and geometry of the clusters, as observed by cross-section transmission electron microscopy. (C) 1999 American Institute of Physics. [S0021-8979(99)00713-6].
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页码:1145 / 1148
页数:4
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