Ultra-high-finesse IV-VI microcavities for the midinfrared

被引：32

作者：

Schwarzl, T ^{[1
]}

Heiss, W ^{[1
]}

Springholz, G ^{[1
]}

机构：

[1] Johannes Kepler Univ Linz, Inst Halbleiter & Festkorperphys, A-4040 Linz, Austria

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 09期

关键词：

D O I：

10.1063/1.124656

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

IV-VI semiconductor-based midinfrared microcavities with very high-quality factors were grown by molecular-beam epitaxy. The structures consist of PbTe/EuTe Bragg mirrors with three to five layer pairs rendering reflectivities in excess of 99.7%. The PbTe resonator layer between the reflectors has an optical length of lambda/2, which yields a first-order cavity. The transmission spectra of the microcavities show a very narrow Lorentzian-shaped Fabry-Perot resonance at 1877 cm(-1) (lambda=5.32 mu m) with a full width at half maximum of 0.63 cm(-1) 78 mu eV. This corresponds to an ultrahigh effective cavity finesse of 1700. (C) 1999 American Institute of Physics. [S0003-6951(99)01235-8].

引用

页码：1246 / 1248

页数：3

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