Third-order optical nonlinearity in ZnO microcrystallite thin films

被引：56

作者：

Zhang, WL

Wang, H

Wong, KS

Tang, ZK

Wong, GKL

Jain, R

机构：

[1] Hong Kong Univ Sci & Technol, Dept Phys, Hong Kong, Peoples R China

[2] Univ New Mexico, Dept Elect Engn, Albuquerque, NM 87106 USA

[3] Univ New Mexico, Dept Phys & Astron, Albuquerque, NM 87106 USA

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 21期

关键词：

D O I：

10.1063/1.125338

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report the measurement of third-order optical nonlinearity (chi((3))) of ZnO microcrystallite thin films near the excitonic resonance at various temperatures using the femtosecond degenerate four-wave-mixing technique. The measured chi((3)) response times are 270, 240, and 160 fs at 4.2 K, 77 K, and room temperature, respectively. The values of chi((3)) range from 10(-7) to 10(-4) esu. The maximum values of chi((3)) always correspond to the absorption peaks at different temperatures. Room-temperature excitonic enhancement of chi((3)) is also observed. (C) 1999 American Institute of Physics. [S0003-6951(99)05047-0].

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页码：3321 / 3323

页数：3

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