Refractive indices of textured indium tin oxide and zinc oxide thin films

被引:78
作者
Yang, Y.
Sun, X. W.
Chen, B. J.
Xu, C. X.
Chen, T. P.
Sun, C. Q.
Tay, B. K.
Sun, Z.
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
[2] E China Normal Univ, Nanotech Ctr, Shanghai 200062, Peoples R China
关键词
zinc oxide; indium tin oxide; ellipsometry; conductivity; optical constants;
D O I
10.1016/j.tsf.2005.12.265
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The refractive indices of textured indium tin oxide (ITO) and zinc oxide (ZnO) thin films were measured and compared. The ITO thin film brown on g-lass and ZnO buffered glass substrates by sputtering showed distinct differences; the refractive index of ITO on glass was about 0.05 higher than that of ITO on ZnO buffered glass in the whole visible spectrum. The ZnO thin film grown on glass and ITO buffered glass substrates by filtered vacuum arc also showed distinct differences; the refractive index of ZnO on glass was higher than that of ZnO on ITO buffered glass in the red and green region, but lower in the blue region. The largest refractive index difference of ZnO on glass and ITO buffered glass was about 0.1 in the visible spectrum. The refractive index variation was correlated with the crystal quality, surface morphology and conductivity of the thin films.(c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:95 / 101
页数:7
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