Transparent ZnO thin-film transistor fabricated by rf magnetron sputtering

被引:1009
作者
Carcia, PF [1 ]
McLean, RS [1 ]
Reilly, MH [1 ]
Nunes, G [1 ]
机构
[1] DuPont Co Inc, Res & Dev, Expt Stn, Wilmington, DE 19880 USA
关键词
D O I
10.1063/1.1553997
中图分类号
O59 [应用物理学];
学科分类号
摘要
We fabricated ZnO thin-film transistors by rf magnetron sputtering on Si substrates held near room temperature. The best devices had field-effect mobility of more than 2 cm2/V s and an on/off ratio>10(6). These ZnO films had resistivity similar to10(5) ohm cm, with high optical transparency (>80% for wavelength >400 nm), and compressive stress <0.5 GPa. The combination of transparency in the visible, excellent transistor characteristics, and low-temperature processing makes ZnO thin-film transistors attractive for flexible electronics on temperature sensitive substrates. (C) 2003 American Institute of Physics.
引用
收藏
页码:1117 / 1119
页数:3
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