Electrical properties of heteroepitaxial grown tin-doped indium oxide films

Oriented thin-film tin-doped indium oxide (ITO) was heteroepitaxically grown on optically polished (100) or (111) planes of single-crystalline yttria-stabilized zirconia (YSZ) substrate using e-beam evaporation or dc magnetron sputtering techniques. Pole figure x-ray diffraction analyses revealed that the heteroepitaxial relations were (001)ITO parallel to(001)YSZ, [100]ITO parallel to[100]YSZ, and (111)ITO parallel to(111)YSZ, [110]ITO parallel to[110]YSZ, respectively. X-ray rocking curve analyses and Rutherford backscattering spectrometry revealed that the e-beam evaporated heteroepitaxial ITO films had much higher crystallinity than the one deposited by de magnetron sputtering. Both carrier density and Hall mobility of the e-beam evaporated heteroepitaxial films showed steady increases in a wide temperature range, which could be interpreted in terms of the increasing Sn-doping efficiency caused by the improvement of the crystallinity of In2O3 host lattice, and hence the decreasing Sn-based neutral scattering centers. (C) 1996 Anerican Institute of Physics.