Influence of time, light and temperature on the electrical properties of zinc oxide TFTs

被引:27
作者
Barquinha, P
Fortunato, E
Gonçalves, A
Pimentel, A
Marques, A
Pereira, L
Martins, R
机构
[1] Univ Nova Lisboa, Fac Sci & Technol, Dept Mat Sci CENIMAT, P-2829516 Caparica, Portugal
[2] Univ Nova Lisboa, CEMOP UNINOVA, P-2829516 Caparica, Portugal
关键词
D O I
10.1016/j.spmi.2005.08.057
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
In this work we present a Study concerning the influence of some of the most important external factors on the electrical properties of transparent thin-film transistors (TFTs), Using zinc oxide produced at room temperature as the semiconductor material. Electrical characterization performed sixteen months after the production of the devices showed a decrease in the on/off ratio from 8 x 10(5) to 1 x 10(5), mainly due to the increase of the off-current. We also observed a small increase in the saturation mobility, a decrease in the threshold voltage and all increase in the gate voltage swing (by factors of about 1.2, 0.9 and 1.6, respectively). Exposure to ambient light does not have a noticeable effect on the electrical properties, which is an important point as regards the application of these devices in active matrix displays. Some variation of the electrical properties was only detectable under intense white light radiation. In order to evaluate the temperature effect oil the TFTs. the), were also characterized at 90 degrees C. At this temperature we noticed that the off-current increased more than two times, and the other electrical properties had a small variation, returning to their initial values after cooling, meaning that the process is totally reversible. (C) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:319 / 327
页数:9
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