Structure of oxide overlayer studied by energy dispersive X-ray diffraction

被引：19

作者：

Dmowski, W

Egami, T

Gorte, R

Vohs, J

机构：

[1] UNIV PENN,DEPT CHEM ENGN,PHILADELPHIA,PA 19104

[2] UNIV PENN,LAB RES STRUCT MATTER,PHILADELPHIA,PA 19104

来源：

PHYSICA B | 1996年 / 221卷 / 1-4期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0921-4526(95)00961-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The atomic structure of CeO2 overlayers on the (001) surface of cubic Yttrium stabilized zirconia was studied by energy-dispersive surface X-ray diffraction. It is shown that the CeO2 layers form epitaxial islands with 5-15 monolayers in thickness with a nearly relaxed lattice constant. The results demonstrate that the energy-dispersive surface X-ray scattering is a powerful tool in certain cases of surface structural studies.

引用

页码：420 / 425

页数：6

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